Spectral polarimetry technique as a complementary tool to ellipsometry of dielectric films

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Date
2011
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Type
URI
http://hdl.handle.net/10183/107245
Event
Optical Society of America. Topical Meeting on Optical Interference Coatings. (11. : 2010 June 6–11 : Tucson)
Subject
In
Applied optics (2004). Washington, DC
Source
Foreign
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