Spectral polarimetry technique as a complementary tool to ellipsometry of dielectric films

Thumbnail
Visualizar/abrir
Data
2011
Autor
Tipo
URI
http://hdl.handle.net/10183/107245
Evento
Optical Society of America. Topical Meeting on Optical Interference Coatings. (11. : 2010 June 6–11 : Tucson)
Assunto
Contido em
Applied optics (2004). Washington, DC
Origem
Estrangeiro
Coleções
 
   

Este item está licenciado na Creative Commons License