Spectral polarimetry technique as a complementary tool to ellipsometry of dielectric films

dc.contributor.author	Pereira, Marcelo Barbalho	pt_BR
dc.contributor.author	Barreto, Bruno Jacques	pt_BR
dc.contributor.author	Horowitz, Flavio	pt_BR
dc.date.accessioned	2014-11-21T02:14:59Z	pt_BR
dc.date.issued	2011	pt_BR
dc.identifier.issn	1559-128X	pt_BR
dc.identifier.uri	http://hdl.handle.net/10183/107245	pt_BR
dc.format.mimetype	application/pdf	pt_BR
dc.language.iso	eng	pt_BR
dc.relation.ispartof	Applied optics (2004). Washington, DC	pt_BR
dc.rights	Open Access	en
dc.subject	Filmes finos	pt_BR
dc.subject	Propriedades óticas	pt_BR
dc.subject	Polarimetria	pt_BR
dc.title	Spectral polarimetry technique as a complementary tool to ellipsometry of dielectric films	pt_BR
dc.type	Trabalho completo publicado em evento	pt_BR
dc.contributor.event	Optical Society of America. Topical Meeting on Optical Interference Coatings. (11. : 2010 June 6–11 : Tucson)	pt_BR
dc.identifier.nrb	000825223	pt_BR
dc.type.origin	Estrangeiro	pt_BR

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