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dc.contributor.authorPereira, Marcelo Barbalhopt_BR
dc.contributor.authorBarreto, Bruno Jacquespt_BR
dc.contributor.authorHorowitz, Flaviopt_BR
dc.date.accessioned2014-11-21T02:14:59Zpt_BR
dc.date.issued2011pt_BR
dc.identifier.issn1559-128Xpt_BR
dc.identifier.urihttp://hdl.handle.net/10183/107245pt_BR
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofApplied optics (2004). Washington, DCpt_BR
dc.rightsOpen Accessen
dc.subjectFilmes finospt_BR
dc.subjectPropriedades óticaspt_BR
dc.subjectPolarimetriapt_BR
dc.titleSpectral polarimetry technique as a complementary tool to ellipsometry of dielectric filmspt_BR
dc.typeTrabalho completo publicado em eventopt_BR
dc.contributor.eventOptical Society of America. Topical Meeting on Optical Interference Coatings. (11. : 2010 June 6–11 : Tucson)pt_BR
dc.identifier.nrb000825223pt_BR
dc.type.originEstrangeiropt_BR


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