A high-fault-coverage approach for the test of data, control, and handshake interconnects in mesh networks-on-chip

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Date
2008
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http://hdl.handle.net/10183/27611
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Abstract
A novel strategy for detecting interconnect faults between distinct channels in networks-on-chip is proposed. Short faults between distinct channels in the data, control, and communication handshake wires are considered in a cost-effective test sequence for mesh NoC topologies based on XY routing.
In
IEEE transactions on computers. New York. Vol. 57, no 9 (Sept. 2008), p. 1202-1215
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Foreign
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