A high-fault-coverage approach for the test of data, control, and handshake interconnects in mesh networks-on-chip

dc.contributor.author	Cota, Erika Fernandes	pt_BR
dc.contributor.author	Kastensmidt, Fernanda Gusmão de Lima	pt_BR
dc.contributor.author	Santos, Maico Cassel dos	pt_BR
dc.contributor.author	Hervé, Marcos Barcellos	pt_BR
dc.contributor.author	Almeida, Pedro Rogério Vieira de	pt_BR
dc.contributor.author	Meirelles, Paulo Roberto Miranda	pt_BR
dc.contributor.author	Amory, Alexandre de Morais	pt_BR
dc.contributor.author	Lubaszewski, Marcelo Soares	pt_BR
dc.date.accessioned	2011-01-29T06:00:40Z	pt_BR
dc.date.issued	2008	pt_BR
dc.identifier.issn	0018-9340	pt_BR
dc.identifier.uri	http://hdl.handle.net/10183/27611	pt_BR
dc.description.abstract	A novel strategy for detecting interconnect faults between distinct channels in networks-on-chip is proposed. Short faults between distinct channels in the data, control, and communication handshake wires are considered in a cost-effective test sequence for mesh NoC topologies based on XY routing.	en
dc.format.mimetype	application/pdf	pt_BR
dc.language.iso	eng	pt_BR
dc.relation.ispartof	IEEE transactions on computers. New York. Vol. 57, no 9 (Sept. 2008), p. 1202-1215	pt_BR
dc.rights	Open Access	en
dc.subject	Fault coverage	en
dc.subject	Microeletrônica	pt_BR
dc.subject	Interconnect testing	en
dc.subject	Test generation	en
dc.subject	Reliability	en
dc.title	A high-fault-coverage approach for the test of data, control, and handshake interconnects in mesh networks-on-chip	pt_BR
dc.type	Artigo de periódico	pt_BR
dc.identifier.nrb	000666993	pt_BR
dc.type.origin	Estrangeiro	pt_BR

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