Browsing Exact and Earth Sciences by Author "Kastensmidt, Fernanda Gusmão de Lima"
Now showing items 1-7 of 7
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An Automatic technique for optimizing reed-solomon codes to improve fault tolerance in memories
Neuberger, Gustavo; Kastensmidt, Fernanda Gusmão de Lima; Reis, Ricardo Augusto da Luz (2005) [Journal article] -
Designing fault-tolerant techniques for SRAM-Based FPGAs
Kastensmidt, Fernanda Gusmão de Lima; Neuberger, Gustavo; Hentschke, Renato Fernandes; Carro, Luigi; Reis, Ricardo Augusto da Luz (2004) [Journal article] -
A high-fault-coverage approach for the test of data, control, and handshake interconnects in mesh networks-on-chip
Cota, Erika Fernandes; Kastensmidt, Fernanda Gusmão de Lima; Santos, Maico Cassel dos; Hervé, Marcos Barcellos; Almeida, Pedro Rogério Vieira de; Meirelles, Paulo Roberto Miranda; Amory, Alexandre de Morais; Lubaszewski, Marcelo Soares (2008) [Journal article]A novel strategy for detecting interconnect faults between distinct channels in networks-on-chip is proposed. Short faults between distinct channels in the data, control, and communication handshake wires are considered ... -
A self-checking scheme to mitigate single event upset effects in SRAM-based FPAAs
Balen, Tiago Roberto; Leite, Franco Ripoll; Kastensmidt, Fernanda Gusmão de Lima; Lubaszewski, Marcelo Soares (2009) [Journal article]In this work the problem of Single Event Upset (SEU) is considered in a recent analog technology: The Field Programmable Analog Arrays (FPAAs). Some FPAA models are based on SRAM memory cells to implement the user ... -
Single event transients in logic circuits - load and propagation induced pulse broadening
Wirth, Gilson Inacio; Kastensmidt, Fernanda Gusmão de Lima; Ribeiro, Ivandro da Silva (2008) [Journal article]The generation and propagation of single event transients (SET) in logic gate chains is studied and modeled. Regarding SET generation, we investigate the dependence of the generated SET pulse width on the struck node ... -
Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection
Henes Neto, Egas; Kastensmidt, Fernanda Gusmão de Lima; Wirth, Gilson Inacio (2008) [Journal article]This paper presents a parameterized current sensor able to detect transient ionization in the silicon substrate. Each sensor is controlled by a set of trimming bits that can be used to attune the sensitivity of the sensor ... -
Using bulk built-in current sensors to detect soft errors
Henes Neto, Egas; Ribeiro, Ivandro da Silva; Vieira, Michele Gusson; Wirth, Gilson Inacio; Kastensmidt, Fernanda Gusmão de Lima (2006) [Journal article]