Browsing Microelectronics by Subject "TCAD"
Now showing items 1-2 of 2
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Evaluating the impact of charge traps on MOSFETs and ciruits
(2016) [Thesis]Nesta tese são apresentados estudos do impacto de armadilhas no desempenho elétrico de MOSFETs em nível de circuito e um simulador Ensamble Monte Carlo (EMC) é apresentado visando a análise do impacto de armadilhas em nível ... -
Reliability evaluation of finFET-based SRAMs in the presence of resistive defects
(2021) [Thesis]The development of Fin Field Effect Transistor (FinFET) has made possible the continuous scaling-down of Complementary Metal-Oxide-Semiconductor (CMOS) technology, overcoming issues caused by the Short-Channel Effects. In ...