Navegação Física por Assunto "Scanning electron microscopy"
Resultados 1-1 de 1
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Compositional, structural and thermoelectric characterization of InxGa1-xSb films deposited by magnetron sputtering and modified by ion irradiation
(2023) [Tese]InxGa1-xSb (x = 0.5, 0.6, 0.8 and 1) films were deposited by radio frequency magnetron sputtering onto SiO2/Si substrates at 420 °C and the compositional, structural and thermoelectric characterizations of the films were ...