Navegação Computação por Autor "Zimpeck, Alexandra Lackmann"
Resultados 1-2 de 2
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Circuit-level approaches to mitigate the process variability and soft errors in finFET logic cells
Zimpeck, Alexandra Lackmann (2019) [Tese]Process variability mitigation and radiation hardness are relevant reliability requirements as chip manufacturing advances more in-depth into the nanometer regime. The parameter yield loss and critical failures on system ... -
Timing vulnerability factor analysis in master-slave D flip-flops
Zimpeck, Alexandra Lackmann (2016) [Dissertação]Technology scaling has brought undesirable issues to maintain the exponential growth rate and it raises important topics related to reliability and robustness of electronic systems. Currently, modern super pipelined ...