MOSFET mismatch modeling : a new approach
dc.contributor.author | Klimach, Hamilton Duarte | pt_BR |
dc.contributor.author | Arnaud, Alfredo | pt_BR |
dc.contributor.author | Montoro, Carlos Galup | pt_BR |
dc.contributor.author | Schneider, Marcio Cherem | pt_BR |
dc.date.accessioned | 2011-01-29T06:00:39Z | pt_BR |
dc.date.issued | 2006 | pt_BR |
dc.identifier.issn | 0740-7475 | pt_BR |
dc.identifier.uri | http://hdl.handle.net/10183/27609 | pt_BR |
dc.format.mimetype | application/pdf | pt_BR |
dc.language.iso | eng | pt_BR |
dc.relation.ispartof | IEEE design and test of computers. California. vol. 23, no. 1 (Jan./Feb. 2006), p. 20-29 | pt_BR |
dc.rights | Open Access | en |
dc.subject | Circuitos eletrônicos | pt_BR |
dc.subject | Microeletrônica | pt_BR |
dc.title | MOSFET mismatch modeling : a new approach | pt_BR |
dc.type | Artigo de periódico | pt_BR |
dc.identifier.nrb | 000645181 | pt_BR |
dc.type.origin | Estrangeiro | pt_BR |
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