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dc.contributor.authorKlimach, Hamilton Duartept_BR
dc.contributor.authorArnaud, Alfredopt_BR
dc.contributor.authorMontoro, Carlos Galuppt_BR
dc.contributor.authorSchneider, Marcio Cherempt_BR
dc.date.accessioned2011-01-29T06:00:39Zpt_BR
dc.date.issued2006pt_BR
dc.identifier.issn0740-7475pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/27609pt_BR
dc.format.mimetypeapplication/pdf
dc.language.isoengpt_BR
dc.relation.ispartofIEEE design and test of computers. California. vol. 23, no. 1 (Jan./Feb. 2006), p. 20-29pt_BR
dc.rightsOpen Accessen
dc.subjectCircuitos eletrônicospt_BR
dc.subjectMicroeletrônicapt_BR
dc.titleMOSFET mismatch modeling : a new approachpt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000645181pt_BR
dc.type.originEstrangeiropt_BR


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