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dc.contributor.authorBeck Filho, Antonio Carlos Schneiderpt_BR
dc.contributor.authorReis, Ricardo Augusto da Luzpt_BR
dc.contributor.authorCarro, Luigipt_BR
dc.contributor.authorHentschke, Renato Fernandespt_BR
dc.contributor.authorLubaszewski, Marcelo Soarespt_BR
dc.contributor.authorMattos, Julio Carlos Balzano dept_BR
dc.date.accessioned2024-03-13T05:03:45Zpt_BR
dc.date.issued2006pt_BR
dc.identifier.issn1807-1953pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/273439pt_BR
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofJournal of integrated circuits and systems. Porto Alegre. Vol. 1, no 4 (Dec. 2006), p. 5-10pt_BR
dc.rightsOpen Accessen
dc.subjectMicroeletrônicapt_BR
dc.subjectTestes funcionaispt_BR
dc.titleUsing genetic algorithms to accelerate automatic software generation for microprocessor functional testingpt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000667126pt_BR
dc.type.originNacionalpt_BR


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