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dc.contributor.authorSevero, Sergio Luiz Schubertpt_BR
dc.contributor.authorSalles, Alvaro Augusto Almeida dept_BR
dc.contributor.authorNervis, Brunopt_BR
dc.contributor.authorZanini, Braian Kaiserpt_BR
dc.date.accessioned2017-07-25T02:31:31Zpt_BR
dc.date.issued2017pt_BR
dc.identifier.issn2179-1074pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/164367pt_BR
dc.description.abstractThe measurement of the dielectric properties of materials has been applied in non-destructive tests, humidity measurement, soil analysis and even cancer detection. The methods have been developed for over 70 years based on the interaction of the electromagnetic waves with the material under test. This work presents a general model of scattering parameters for non-resonant methods of transmission/reflection and single-port reflection. Equations for determining permittivity are obtained. New equations for short-circuited load and coupled load in the double reflection method are presented.en
dc.format.mimetypeapplication/pdf
dc.language.isoengpt_BR
dc.relation.ispartofJournal of microwaves, optoelectronics and electromagnetic applications. São Caetano do Sul, SP. vol. 16, no. 1 (Mar. 2017), p. 297-311pt_BR
dc.rightsOpen Accessen
dc.subjectMicroondaspt_BR
dc.subjectMicrowave measurementsen
dc.subjectPermittivityen
dc.subjectCurto-circuitopt_BR
dc.subjectMétodos numéricospt_BR
dc.subjectShort-circuit transmission line methoden
dc.subjectTransmission/reflection methoden
dc.titleNon-resonant permittivity measurement methodspt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb001021179pt_BR
dc.type.originNacionalpt_BR


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