Simple polarimetric approach to direct measurement of the near-surface refractive index in graded-index films

View/ Open
Date
2003Type
Abstract
In the standardM-line method for the characterization of graded-index films, an analytical curve is fitted to the waveguide mode measurements and extrapolated to provide the refractive index in the zero-depth limit. Here we review our polarimetric approach to a direct near-surface measurement, which complements the M-line method. Also, we present its new and more straightforward version, which is applicable to existing samples and does not require masking before ion exchange. © 2003 Optical Soc ...
In the standardM-line method for the characterization of graded-index films, an analytical curve is fitted to the waveguide mode measurements and extrapolated to provide the refractive index in the zero-depth limit. Here we review our polarimetric approach to a direct near-surface measurement, which complements the M-line method. Also, we present its new and more straightforward version, which is applicable to existing samples and does not require masking before ion exchange. © 2003 Optical Society of America. ...
In
Applied optics. New York. Vol. 42, no. 16 (June 2003), p. 3268-3270
Source
Foreign
Collections
-
Journal Articles (26441)Exact and Earth Sciences (4611)
This item is licensed under a Creative Commons License
