Simple polarimetric approach to direct measurement of the near-surface refractive index in graded-index films

Abstract

In the standardM-line method for the characterization of graded-index films, an analytical curve is fitted to the waveguide mode measurements and extrapolated to provide the refractive index in the zero-depth limit. Here we review our polarimetric approach to a direct near-surface measurement, which complements the M-line method. Also, we present its new and more straightforward version, which is applicable to existing samples and does not require masking before ion exchange. © 2003 Optical Society of America.