Simple polarimetric approach to direct measurement of the near-surface refractive index in graded-index films

dc.contributor.author	Pereira, Marcelo Barbalho	pt_BR
dc.contributor.author	Horowitz, Flavio	pt_BR
dc.date.accessioned	2014-11-20T02:14:44Z	pt_BR
dc.date.issued	2003	pt_BR
dc.identifier.issn	0003-6935	pt_BR
dc.identifier.uri	http://hdl.handle.net/10183/107158	pt_BR
dc.description.abstract	In the standardM-line method for the characterization of graded-index films, an analytical curve is fitted to the waveguide mode measurements and extrapolated to provide the refractive index in the zero-depth limit. Here we review our polarimetric approach to a direct near-surface measurement, which complements the M-line method. Also, we present its new and more straightforward version, which is applicable to existing samples and does not require masking before ion exchange.	en
dc.format.mimetype	application/pdf	pt_BR
dc.language.iso	eng	pt_BR
dc.relation.ispartof	Applied optics. New York. Vol. 42, no. 16 (June 2003), p. 3268-3270	pt_BR
dc.rights	Open Access	en
dc.subject	Troca iônica	pt_BR
dc.subject	Filmes oticos	pt_BR
dc.subject	Polarimetria	pt_BR
dc.title	Simple polarimetric approach to direct measurement of the near-surface refractive index in graded-index films	pt_BR
dc.type	Artigo de periódico	pt_BR
dc.identifier.nrb	000371781	pt_BR
dc.type.origin	Estrangeiro	pt_BR

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