Navegação por Autor "Gonçalez, Odair Lelis"
Resultados 1-2 de 2
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Reliability analysis of 0.5µm CMOS operational amplifiers under TID effects
Cardoso, Guilherme Schwanke; Balen, Tiago Roberto; Lubaszewski, Marcelo Soares; Gonçalez, Odair Lelis (2014) [Artigo de periódico] -
Testing a fault tolerant mixed-signal design under TID and heavy ions
González Aguilera, Carlos Julio; Machado, Diego do Nascimento; Vaz, Rafael Galhardo; Vilas Bôas, Alexis Cristiano; Gonçalez, Odair Lelis; Puchner, Helmut K.; Added, Nemitala; Macchione, Eduardo; Aguiar, Vitor Ângelo Paulino de; Kastensmidt, Fernanda Gusmão de Lima; Medina, Nilberto Hedar; Guazzelli, Marcilei Aparecida; Balen, Tiago Roberto (2021) [Artigo de periódico]This work presents results of three distinctradiation tests performed upon a fault tolerant data acqui-sition system comprising a design diversity redundancytechnique. The first and second experiments are Total Ion-izing ...