Browsing by Author "Gonçalez, Odair Lelis"

Now showing items 1-2 of 2

    • Reliability analysis of 0.5µm CMOS operational amplifiers under TID effects 

      Cardoso, Guilherme Schwanke; Balen, Tiago Roberto; Lubaszewski, Marcelo Soares; Gonçalez, Odair Lelis (2014) [Journal article]

    • Testing a fault tolerant mixed-signal design under TID and heavy ions 

      González Aguilera, Carlos Julio; Machado, Diego do Nascimento; Vaz, Rafael Galhardo; Vilas Bôas, Alexis Cristiano; Gonçalez, Odair Lelis; Puchner, Helmut K.; Added, Nemitala; Macchione, Eduardo; Aguiar, Vitor Ângelo Paulino de; Kastensmidt, Fernanda Gusmão de Lima; Medina, Nilberto Hedar; Guazzelli, Marcilei Aparecida; Balen, Tiago Roberto (2021) [Journal article]
      This work presents results of three distinctradiation tests performed upon a fault tolerant data acqui-sition system comprising a design diversity redundancytechnique. The first and second experiments are Total Ion-izing ...