Device degradation and resilient computing

dc.contributor.author	Glösekötter, Peter	pt_BR
dc.contributor.author	Greveler, Ulrich	pt_BR
dc.contributor.author	Wirth, Gilson Inacio	pt_BR
dc.date.accessioned	2011-07-22T06:00:51Z	pt_BR
dc.date.issued	2008	pt_BR
dc.identifier.uri	http://hdl.handle.net/10183/30284	pt_BR
dc.format.mimetype	application/pdf	pt_BR
dc.language.iso	eng	pt_BR
dc.relation.ispartof	IEEE International Symposium on Circuits and Systems (2008 May 18-21 : Seattle, Washington). [Proceedings]. [Los Alamitos] : IEEE, 2008.	pt_BR
dc.rights	Open Access	en
dc.subject	Microeletrônica	pt_BR
dc.title	Device degradation and resilient computing	pt_BR
dc.type	Trabalho completo publicado em evento	pt_BR
dc.contributor.event	Iscas ( 2008 May 18-21 : Seattle, Washington)	pt_BR
dc.identifier.nrb	000649170	pt_BR
dc.type.origin	Estrangeiro	pt_BR

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