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Device degradation and resilient computing
dc.contributor.author | Glösekötter, Peter | pt_BR |
dc.contributor.author | Greveler, Ulrich | pt_BR |
dc.contributor.author | Wirth, Gilson Inacio | pt_BR |
dc.date.accessioned | 2011-07-22T06:00:51Z | pt_BR |
dc.date.issued | 2008 | pt_BR |
dc.identifier.uri | http://hdl.handle.net/10183/30284 | pt_BR |
dc.format.mimetype | application/pdf | pt_BR |
dc.language.iso | eng | pt_BR |
dc.relation.ispartof | IEEE International Symposium on Circuits and Systems (2008 May 18-21 : Seattle, Washington). [Proceedings]. [Los Alamitos] : IEEE, 2008. | pt_BR |
dc.rights | Open Access | en |
dc.subject | Microeletrônica | pt_BR |
dc.title | Device degradation and resilient computing | pt_BR |
dc.type | Trabalho completo publicado em evento | pt_BR |
dc.contributor.event | Iscas ( 2008 May 18-21 : Seattle, Washington) | pt_BR |
dc.identifier.nrb | 000649170 | pt_BR |
dc.type.origin | Estrangeiro | pt_BR |
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