Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection
dc.contributor.author | Henes Neto, Egas | pt_BR |
dc.contributor.author | Kastensmidt, Fernanda Gusmão de Lima | pt_BR |
dc.contributor.author | Wirth, Gilson Inacio | pt_BR |
dc.date.accessioned | 2011-01-29T06:00:41Z | pt_BR |
dc.date.issued | 2008 | pt_BR |
dc.identifier.issn | 0018-9499 | pt_BR |
dc.identifier.uri | http://hdl.handle.net/10183/27615 | pt_BR |
dc.description.abstract | This paper presents a parameterized current sensor able to detect transient ionization in the silicon substrate. Each sensor is controlled by a set of trimming bits that can be used to attune the sensitivity of the sensor compensating process and temperature variations. By choosing different configurations in the trimming bits, it is possible to adjust the performance of the sensor, which can increase the number of transistors monitored by a single sensor reducing the area overhead. Monte Carlo simulations are used to evaluate the sensor behavior. Results from a case-study circuit with embedded Tbulk-BICS confirm the efficiency of the technique. | en |
dc.format.mimetype | application/pdf | |
dc.language.iso | eng | pt_BR |
dc.relation.ispartof | IEEE transactions on nuclear science. New York. vol. 55, no. 4, part 1 (Aug. 2008), p. 2281-2288 | pt_BR |
dc.rights | Open Access | en |
dc.subject | Built-in current sensor | en |
dc.subject | Microeletrônica | pt_BR |
dc.subject | Fault tolerance | en |
dc.subject | Process variations | en |
dc.subject | Soft errors | en |
dc.title | Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection | pt_BR |
dc.type | Artigo de periódico | pt_BR |
dc.identifier.nrb | 000684869 | pt_BR |
dc.type.origin | Estrangeiro | pt_BR |
Este item está licenciado na Creative Commons License
-
Artigos de Periódicos (39552)Ciências Exatas e da Terra (6036)
-
Artigos de Periódicos (39552)Engenharias (2413)