Navegação Ciências Exatas e da Terra por Assunto "Estequiometria"
Resultados 1-10 de 10
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Compositional stability of hafnium aluminates thin films deposited on Si by atomic layer deposition
(2005) [Artigo de periódico]We have used nuclear reaction analyses and Rutherford backscattering spectrometry to investigate quantitatively the compositional stability of hafnium aluminate thin films deposited on Sis001d by atomic layer deposition ... -
Determination of thickness and composition of high-k dielectrics using high-energy electrons
(2013) [Artigo de periódico]We demonstrate the application of high-energy elastic electron backscattering to the analysis of thin (2–20 nm) HfO2 overlayers on oxidized Si substrates. The film composition and thickness are determined directly from ... -
Effect of composition and short-range order on the magnetic moments of Fe in Fe/sub 1-x/V/sub x/ alloys
(2000) [Artigo de periódico]We report dc magnetization, Mössbauer spectroscopy, and x-ray-diffraction measurements on Fe₁₋xVx alloys, quenched or heat treated, with single phase bcc structure in the whole concetration range. It is well known that the ... -
Electronic and crystallographic structure, hard x-ray photoemission, and mechanical and transport properties of the half-metallic Heusler compound Co2MnGe
(2011) [Artigo de periódico]This work reports on the electronic and crystalline structure and the mechanical, magnetic, and transport properties of the polycrystalline Heusler compound Co2MnGe. The crystalline structure was examined in detail by ... -
GeO2/Ge structure submitted to annealing in deuterium : incorporation pathways and associated oxide modifications
(2014) [Artigo de periódico]Deuterium (D) incorporation in GeO2/Ge structures following D2 annealing was investigated. Higher D concentrations were obtained for GeO2/Ge samples in comparison to their SiO2/Si counterparts annealed in the same conditions. ... -
High-resolution depth profiling in ultrathin Al/sub 2/O/sub 3/ films on Si
(2000) [Artigo de periódico]A combination of two complementary depth profiling techniques with sub-nm depth resolution, nuclear resonance profiling and medium energy ion scattering, and cross-sectional high-resolution transmission electron microscopy ... -
Physicochemical, structural, and mechanical properties of Si3N4 films annealed in O2
(2010) [Artigo de periódico]The physicochemical, structural, and mechanical properties of silicon nitride films deposited by radio frequency reactive magnetron sputtering were investigated before and after thermal annealing in 18O2. As-deposited films ... -
Reaction-diffusion model for thermal growth of silicon nitride films on Si
(2000) [Artigo de periódico]Thermal growth of ultrathin silicon nitride films on Si in NH₃ is modeled as a dynamic system governed by reaction-diffusion equations. Solution of the model yields profiles of the involved species consistent with experimental ... -
Structural characterization of CdSe/ZnS quantum dots using medium energy ion scattering
(2012) [Artigo de periódico]In the present work, we have analyzed CdSe/ZnS core-shell quantum dots by medium energy ion scattering (MEIS), which is a powerful technique to explore the synthesis, formation, stability, and elemental distribution of ... -
Tuning the ferromagnetic-antiferromagnetic interfaces of granular Co-CoO exchange bias systems by annealing
(2014) [Artigo de periódico]The low-temperature magnetic behavior of granular Co-CoO exchange bias systems, prepared by oxygen ion implantation in Co thin films and subsequent annealing, is addressed. The thermal activation effects lead to an O ...