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dc.contributor.authorHorowitz, Flaviopt_BR
dc.contributor.authorMichels, Alexandre Fassinipt_BR
dc.date.accessioned2014-11-20T02:15:26Zpt_BR
dc.date.issued2008pt_BR
dc.identifier.issn1559-128Xpt_BR
dc.identifier.urihttp://hdl.handle.net/10183/107167pt_BR
dc.description.abstractDouble optical monitoring is applied to determine the influence of main process parameters on the formation of sulfated zirconia and self-assembled mesoporous silica solgel films by dip coating. In addition, we analyze, for the first time to the best of our knowledge, the influence of withdrawal speed, temperature, and relative humidity on refractive-index and physical thickness variations (uncertainties of 0.005 and 7 nm) during the process. Results provide insight into controlled production of single and multilayer films from complex fluids by dip coating.en
dc.format.mimetypeapplication/pdf
dc.language.isoengpt_BR
dc.relation.ispartofApplied optics (2004). Washington, DC. Vol. 47, no. 13 (May 2008), p. C185-C188pt_BR
dc.rightsOpen Accessen
dc.subjectMateriais mesoporosospt_BR
dc.subjectFilmes líquidospt_BR
dc.subjectIndice de refracaopt_BR
dc.subjectCompostos de silíciopt_BR
dc.subjectCompostos de zirconiopt_BR
dc.titleAnalysis of dip coating processing parameters by double optical monitoringpt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000645757pt_BR
dc.type.originEstrangeiropt_BR


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