Analysis of dip coating processing parameters by double optical monitoring

dc.contributor.author	Horowitz, Flavio	pt_BR
dc.contributor.author	Michels, Alexandre Fassini	pt_BR
dc.date.accessioned	2014-11-20T02:15:26Z	pt_BR
dc.date.issued	2008	pt_BR
dc.identifier.issn	1559-128X	pt_BR
dc.identifier.uri	http://hdl.handle.net/10183/107167	pt_BR
dc.description.abstract	Double optical monitoring is applied to determine the influence of main process parameters on the formation of sulfated zirconia and self-assembled mesoporous silica solgel films by dip coating. In addition, we analyze, for the first time to the best of our knowledge, the influence of withdrawal speed, temperature, and relative humidity on refractive-index and physical thickness variations (uncertainties of 0.005 and 7 nm) during the process. Results provide insight into controlled production of single and multilayer films from complex fluids by dip coating.	en
dc.format.mimetype	application/pdf	pt_BR
dc.language.iso	eng	pt_BR
dc.relation.ispartof	Applied optics (2004). Washington, DC. Vol. 47, no. 13 (May 2008), p. C185-C188	pt_BR
dc.rights	Open Access	en
dc.subject	Materiais mesoporosos	pt_BR
dc.subject	Filmes líquidos	pt_BR
dc.subject	Indice de refracao	pt_BR
dc.subject	Compostos de silício	pt_BR
dc.subject	Compostos de zirconio	pt_BR
dc.title	Analysis of dip coating processing parameters by double optical monitoring	pt_BR
dc.type	Artigo de periódico	pt_BR
dc.identifier.nrb	000645757	pt_BR
dc.type.origin	Estrangeiro	pt_BR

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