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dc.contributor.authorMichels, Alexandre Fassinipt_BR
dc.contributor.authorMenegotto, Thiagopt_BR
dc.contributor.authorHorowitz, Flaviopt_BR
dc.date.accessioned2014-11-20T02:14:45Zpt_BR
dc.date.issued2004pt_BR
dc.identifier.issn1559-128Xpt_BR
dc.identifier.urihttp://hdl.handle.net/10183/107159pt_BR
dc.description.abstractDip-coated films, which are widely used in the coating industry, are usually measured by capacitive methods with micrometric precision. For the first time to our knowledge, we have applied an interferometric determination of the evolution of thickness in real time to nonvolatile Newtonian mineral oils with several viscosities and distinct dip withdrawing speeds. The evolution of film thickness during the process depends on time as t 1 2, in accordance with a simple model. Comparison with measured results with an uncertainty of 0.007 m showed good agreement after the initial steps of the process had been completed.en
dc.format.mimetypeapplication/pdf
dc.language.isoengpt_BR
dc.relation.ispartofApplied optics (2004). Washington, DC. Vol. 43, no. 4 (Feb. 2004), p. 820-823pt_BR
dc.rightsOpen Accessen
dc.subjectInterferometria luminosapt_BR
dc.subjectFilmes oticospt_BR
dc.subjectViscosidadept_BR
dc.subjectPolarimetriapt_BR
dc.titleInterferometric monitoring of dip coatingpt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000400820pt_BR
dc.type.originEstrangeiropt_BR


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