Interferometric monitoring of dip coating

dc.contributor.author	Michels, Alexandre Fassini	pt_BR
dc.contributor.author	Menegotto, Thiago	pt_BR
dc.contributor.author	Horowitz, Flavio	pt_BR
dc.date.accessioned	2014-11-20T02:14:45Z	pt_BR
dc.date.issued	2004	pt_BR
dc.identifier.issn	1559-128X	pt_BR
dc.identifier.uri	http://hdl.handle.net/10183/107159	pt_BR
dc.description.abstract	Dip-coated films, which are widely used in the coating industry, are usually measured by capacitive methods with micrometric precision. For the first time to our knowledge, we have applied an interferometric determination of the evolution of thickness in real time to nonvolatile Newtonian mineral oils with several viscosities and distinct dip withdrawing speeds. The evolution of film thickness during the process depends on time as t 1 2, in accordance with a simple model. Comparison with measured results with an uncertainty of 0.007 m showed good agreement after the initial steps of the process had been completed.	en
dc.format.mimetype	application/pdf	pt_BR
dc.language.iso	eng	pt_BR
dc.relation.ispartof	Applied optics (2004). Washington, DC. Vol. 43, no. 4 (Feb. 2004), p. 820-823	pt_BR
dc.rights	Open Access	en
dc.subject	Interferometria luminosa	pt_BR
dc.subject	Filmes oticos	pt_BR
dc.subject	Viscosidade	pt_BR
dc.subject	Polarimetria	pt_BR
dc.title	Interferometric monitoring of dip coating	pt_BR
dc.type	Artigo de periódico	pt_BR
dc.identifier.nrb	000400820	pt_BR
dc.type.origin	Estrangeiro	pt_BR

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