Navegação por Assunto "Filmes oticos"
Resultados 1-8 de 8
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Análise pelo método de Abelès com extensão de Hacskaylo para filmes ópticos produzidos pelo método de íon exchange
(1995) [Resumo publicado em evento] -
Caracterização de filmes ópticos compósitos nano-estruturados, inomogêneos ou anisotrópicos, produzidos por troca iônica e pelo método sol-gel
(2003) [Tese]Este trabalho tem como objetivo o desenvolvimento e a aplicação de métodos de caracterização de filmes ópticos, associados à sua estrutura inomogênea ou anisotrópica. Os materiais estudados são guias ópticos planares e ... -
Double optical monitoring of dip coating with a time-varying refractive index
(2006) [Artigo de periódico]A brief overview of optical monitoring for vacuum and wet-bench film-deposition processes is presented. Interferometric and polarimetric measurements are combined with regard to simultaneous monitoring of refractive index ... -
Envelope and waveguide methods : a comparative study of PbF2 and CeO2 birefringent films
(1994) [Artigo de periódico]We have characterized low-birefringence, PbF2 coatings to permit, first, agreement between envelope and prism-coupler waveguide methods under the standard isotropic assumption. In essentially the same measurement conditions, ... -
FECO-based observations of birefringence at normal incidence in optical coatings
(1985) [Artigo de periódico]Resumo não disponível -
Generalized Abèles relations for an anisotropic thin film with an arbitrary dielectric tensor : comments
(1998) [Artigo de periódico]The Cojocaru generalization of the 2 3 2 extended Jones matrix method, placed in a wider context of previous approaches to anisotropic optical thin films, is analyzed from a complementary perspective. This, contrary to ... -
Interferometric monitoring of dip coating
(2004) [Artigo de periódico]Dip-coated films, which are widely used in the coating industry, are usually measured by capacitive methods with micrometric precision. For the first time to our knowledge, we have applied an interferometric determination ... -
Simple polarimetric approach to direct measurement of the near-surface refractive index in graded-index films
(2003) [Artigo de periódico]In the standardM-line method for the characterization of graded-index films, an analytical curve is fitted to the waveguide mode measurements and extrapolated to provide the refractive index in the zero-depth limit. Here ...