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dc.contributor.authorSortica, Maurício de Albuquerquept_BR
dc.contributor.authorGrande, Pedro Luispt_BR
dc.contributor.authorMachado, Giovannapt_BR
dc.contributor.authorMiotti, Leonardopt_BR
dc.date.accessioned2014-06-06T02:06:35Zpt_BR
dc.date.issued2009pt_BR
dc.identifier.issn0021-8979pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/96123pt_BR
dc.description.abstractIn this work we review the use of the medium-energy ion scattering (MEIS) technique to characterize nanostructures at the surface of a substrate. We discuss here how the determination of shape and size distribution of the nanoparticles is influenced by the energy loss at the backscattering collision, which leads to an asymmetrical energy-loss line shape.We show that the use of a Gaussian line shape may lead to important misinterpretations of a MEIS spectrum for nanoparticles smaller than 5 nm. The results are compared to measurements of gold nanoparticles adsorbed on a multilayered film of weak polyelectrolyte.en
dc.format.mimetypeapplication/pdf
dc.language.isoengpt_BR
dc.relation.ispartofJournal of applied physics. Melville. Vol. 106, no. 11 (Dec. 2009), 114320, 7 p.pt_BR
dc.rightsOpen Accessen
dc.subjectFísica da matéria condensadapt_BR
dc.subjectPerda de energia de particulaspt_BR
dc.subjectRetroespalhamento rutherfordpt_BR
dc.subjectAdsorçãopt_BR
dc.subjectNanoparticulaspt_BR
dc.subjectFilmes finospt_BR
dc.subjectQuímica de superfíciespt_BR
dc.titleCharacterization of nanoparticles through medium-energy ion scatteringpt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000731667pt_BR
dc.type.originEstrangeiropt_BR


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