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New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix

dc.contributor.authorSanchez, Dario Ferreirapt_BR
dc.contributor.authorMarmitt, Gabriel Guterrespt_BR
dc.contributor.authorMarin, Cristianept_BR
dc.contributor.authorBaptista, Daniel Lorscheitterpt_BR
dc.contributor.authorAzevedo, Gustavo de Medeirospt_BR
dc.contributor.authorGrande, Pedro Luispt_BR
dc.contributor.authorFichtner, Paulo Fernando Papaleopt_BR
dc.date.accessioned2014-04-13T01:50:01Zpt_BR
dc.date.issued2013pt_BR
dc.identifier.issn2045-2322pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/93392pt_BR
dc.description.abstractIn this work we demonstrate that Medium Energy Ion Scattering (MEIS) measurements in combination with Transmission Electron Microscopy (TEM) or Grazing Incidence Small Angle X-Ray Scattering (GISAXS) can provide a complete characterization of nanoparticle (NP) systems embedded into dielectric films. This includes the determination of the nanoparticle characteristics (location, size distribution and number concentration) as well as the depth distribution and concentration of the NP atomic components dispersed in the matrix. Our studies are performed considering a model case system consisting of planar arrangements of Au NPs (size range from 1 to 10 nm) containing three distinct Au concentrations embedded in a SiO2 film.en
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofScientific reports. London. Vol. 3 (Dec. 2013), 3414, 6 p.pt_BR
dc.rightsOpen Accessen
dc.subjectNanopartículaspt_BR
dc.subjectPropriedades estruturaispt_BR
dc.subjectEspalhamentopt_BR
dc.subjectMicroscopia eletrônica de transmissãopt_BR
dc.titleNew approach for structural characterization of planar sets of nanoparticles embedded into a solid matrixpt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000911636pt_BR
dc.type.originEstrangeiropt_BR


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