Using bulk built-in current sensors to detect soft errors
dc.contributor.author | Henes Neto, Egas | pt_BR |
dc.contributor.author | Ribeiro, Ivandro da Silva | pt_BR |
dc.contributor.author | Vieira, Michele Gusson | pt_BR |
dc.contributor.author | Wirth, Gilson Inacio | pt_BR |
dc.contributor.author | Kastensmidt, Fernanda Gusmão de Lima | pt_BR |
dc.date.accessioned | 2011-02-08T05:59:20Z | pt_BR |
dc.date.issued | 2006 | pt_BR |
dc.identifier.issn | 0272-1732 | pt_BR |
dc.identifier.uri | http://hdl.handle.net/10183/27691 | pt_BR |
dc.format.mimetype | application/pdf | pt_BR |
dc.language.iso | eng | pt_BR |
dc.relation.ispartof | IEEE micro : chips, systems, software, and applications. Los Alamitos. p. 10-18 | pt_BR |
dc.rights | Open Access | en |
dc.subject | Microeletrônica | pt_BR |
dc.title | Using bulk built-in current sensors to detect soft errors | pt_BR |
dc.type | Artigo de periódico | pt_BR |
dc.identifier.nrb | 000578594 | pt_BR |
dc.type.origin | Estrangeiro | pt_BR |
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