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dc.contributor.authorHenes Neto, Egaspt_BR
dc.contributor.authorRibeiro, Ivandro da Silvapt_BR
dc.contributor.authorVieira, Michele Gussonpt_BR
dc.contributor.authorWirth, Gilson Inaciopt_BR
dc.contributor.authorKastensmidt, Fernanda Gusmão de Limapt_BR
dc.date.accessioned2011-02-08T05:59:20Zpt_BR
dc.date.issued2006pt_BR
dc.identifier.issn0272-1732pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/27691pt_BR
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofIEEE micro : chips, systems, software, and applications. Los Alamitos. p. 10-18pt_BR
dc.rightsOpen Accessen
dc.subjectMicroeletrônicapt_BR
dc.titleUsing bulk built-in current sensors to detect soft errorspt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000578594pt_BR
dc.type.originEstrangeiropt_BR


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