• Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection 

      Henes Neto, Egas; Kastensmidt, Fernanda Gusmão de Lima; Wirth, Gilson Inacio (2008) [Artigo de periódico]
      This paper presents a parameterized current sensor able to detect transient ionization in the silicon substrate. Each sensor is controlled by a set of trimming bits that can be used to attune the sensitivity of the sensor ...
    • Testing a fault tolerant mixed-signal design under TID and heavy ions 

      González Aguilera, Carlos Julio; Machado, Diego do Nascimento; Vaz, Rafael Galhardo; Vilas Bôas, Alexis Cristiano; Gonçalez, Odair Lelis; Puchner, Helmut K.; Added, Nemitala; Macchione, Eduardo; Aguiar, Vitor Ângelo Paulino de; Kastensmidt, Fernanda Gusmão de Lima; Medina, Nilberto Hedar; Guazzelli, Marcilei Aparecida; Balen, Tiago Roberto (2021) [Artigo de periódico]
      This work presents results of three distinctradiation tests performed upon a fault tolerant data acqui-sition system comprising a design diversity redundancytechnique. The first and second experiments are Total Ion-izing ...