Now showing items 1-1 of 1

    • Electrical conductivity in electrodeposited Cu-Ge(O) alloy films 

      Zhao, Fu; Xu, Yin; Tumelero, Milton André; Pelegrini, Silvia; Pasa, Andre Avelino; Zangari, Giovanni (2018) [Journal article]
      Integrated circuits currently use mainly copper as the interconnect material; unfortunately the ongoing miniaturization currently requires materials with higher electromigration resistance and possibly improved conductivity. ...