Browsing Exact and Earth Sciences by Subject "Single event upset"
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A self-checking scheme to mitigate single event upset effects in SRAM-based FPAAs
(2009) [Journal article]In this work the problem of Single Event Upset (SEU) is considered in a recent analog technology: The Field Programmable Analog Arrays (FPAAs). Some FPAA models are based on SRAM memory cells to implement the user ...