Experimental and analytical study of xeon phi reliability

dc.contributor.author	Oliveira, Daniel Alfonso Gonçalves de	pt_BR
dc.contributor.author	Pilla, Laercio Lima	pt_BR
dc.contributor.author	DeBardeleben, Nathan	pt_BR
dc.contributor.author	Blanchard, Sean	pt_BR
dc.contributor.author	Quinn, Heather	pt_BR
dc.contributor.author	Koren, Israel	pt_BR
dc.contributor.author	Navaux, Philippe Olivier Alexandre	pt_BR
dc.contributor.author	Rech, Paolo	pt_BR
dc.date.accessioned	2018-01-13T02:24:44Z	pt_BR
dc.date.issued	2017	pt_BR
dc.identifier.uri	http://hdl.handle.net/10183/171994	pt_BR
dc.format.mimetype	application/pdf	pt_BR
dc.language.iso	eng	pt_BR
dc.relation.ispartof	ACM International Conference for High Performance Computing, Networking, Storage and Analysis, SUPERCOMPUTING ( 2017 Nov. 12-17 : Denver, Colorado). Proceedings. New York : ACM, c2017	pt_BR
dc.rights	Open Access	en
dc.subject	Radiation experiments	en
dc.subject	Tolerancia : Falhas	pt_BR
dc.subject	Processamento paralelo	pt_BR
dc.subject	Fault injection	en
dc.subject	Parallel architectures	en
dc.subject	Fault tolerance	en
dc.subject	Reliability	en
dc.title	Experimental and analytical study of xeon phi reliability	pt_BR
dc.type	Trabalho completo publicado em evento	pt_BR
dc.identifier.nrb	001058179	pt_BR
dc.type.origin	Estrangeiro	pt_BR

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