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Generalized Abèles relations for an anisotropic thin film with an arbitrary dielectric tensor : comments
dc.contributor.author | Horowitz, Flavio | pt_BR |
dc.date.accessioned | 2014-11-20T02:14:42Z | pt_BR |
dc.date.issued | 1998 | pt_BR |
dc.identifier.issn | 0003-6935 | pt_BR |
dc.identifier.uri | http://hdl.handle.net/10183/107157 | pt_BR |
dc.description.abstract | The Cojocaru generalization of the 2 3 2 extended Jones matrix method, placed in a wider context of previous approaches to anisotropic optical thin films, is analyzed from a complementary perspective. This, contrary to initial belief, allows for a simple proof that one may include multiple reflections by taking into account total fields into the anisotropic film, and this therefore provides support for a more widespread use of the method. | en |
dc.format.mimetype | application/pdf | pt_BR |
dc.language.iso | eng | pt_BR |
dc.relation.ispartof | Applied optics. New York. Vol. 37, no. 19 (July 1998), p. 4268-4269 | pt_BR |
dc.rights | Open Access | en |
dc.subject | Filmes finos dieletricos | pt_BR |
dc.subject | Filmes oticos | pt_BR |
dc.subject | Propagação de luz | pt_BR |
dc.title | Generalized Abèles relations for an anisotropic thin film with an arbitrary dielectric tensor : comments | pt_BR |
dc.type | Artigo de periódico | pt_BR |
dc.identifier.nrb | 000223719 | pt_BR |
dc.type.origin | Estrangeiro | pt_BR |
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