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dc.contributor.authorHorowitz, Flaviopt_BR
dc.contributor.authorMendes, Sergio Britopt_BR
dc.date.accessioned2014-11-20T02:14:41Zpt_BR
dc.date.issued1994pt_BR
dc.identifier.issn0003-6935pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/107156pt_BR
dc.description.abstractWe have characterized low-birefringence, PbF2 coatings to permit, first, agreement between envelope and prism-coupler waveguide methods under the standard isotropic assumption. In essentially the same measurement conditions, for obliquely deposited (58.30) CeO2 coatings the isotropic model becomes unsustainable. Explicit consideration of the film microstructure is then required for good correlation between thickness results from TE (503 ± 9 nm) and TM (504 ± 10 nm) modes in the waveguide experiment as well as between refractive-index results from envelope (n2 = 1.78 + 0.03) and waveguide (n2 = 1.794 + 0.002) techniques. We considered uniaxial and biaxial models to achieve consistency, and the refractive indices along the principal axes of symmetry were determined.en
dc.format.mimetypeapplication/pdf
dc.language.isoengpt_BR
dc.relation.ispartofApplied optics. New York. Vol. 33, n. 13 (May 1994), p. 2659-2663pt_BR
dc.rightsOpen Accessen
dc.subjectIndice de refracaopt_BR
dc.subjectThin filmsen
dc.subjectGuias de ondaspt_BR
dc.subjectBirefringenceen
dc.subjectCharacterizationen
dc.subjectBirrefringenciapt_BR
dc.subjectFilmes oticospt_BR
dc.subjectCompostos de Cériopt_BR
dc.subjectCompostos de chumbopt_BR
dc.titleEnvelope and waveguide methods : a comparative study of PbF2 and CeO2 birefringent filmspt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000220147pt_BR
dc.type.originEstrangeiropt_BR


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