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dc.contributor.authorGeshev, Julian Penkovpt_BR
dc.contributor.authorPereira, Luis Gustavopt_BR
dc.contributor.authorSchmidt, Joao Edgarpt_BR
dc.contributor.authorNagamine, Luiz Carlos Camargo Mirandapt_BR
dc.contributor.authorBaggio-Saitovitch, E.pt_BR
dc.contributor.authorPelegrini, Fernandopt_BR
dc.date.accessioned2014-10-08T02:11:15Zpt_BR
dc.date.issued2003pt_BR
dc.identifier.issn1098-0121pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/104259pt_BR
dc.description.abstractFerromagnetic (FM) resonance and magnetization curve measurements were performed at room temperature for a polycrystalline Ni81Fe19 coupled to NiO. It was observed that the shape of the angular variation of the resonance field is frequency dependent, with the curve at 9.65 GHz typical for a strongly exchange-coupled bilayer, while the 34.0 GHz curve is characteristic for relatively weak interactions. Numerical simulations of the resonance field and of the hysteresis loop shift, carried out through the domain wall formation model, as well as the resonance linewidth data indicated that there must be two fractions in the antiferromagnetic part of the interface, with stable and unstable grains. Only the stable grains contribute to the exchange bias. In our sample, whether an interfacial antiferromagnetic grain is stable or not is predominantly determined by the strength of the exhange coupling between this grain and the adjacent FM domain. The stable antiferromagnetic grains, whose contribution is sensed by the resonance experiment, are the smaller ones, which are more strongly coupled to the ferromagnet than the larger grains.en
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofPhysical review. B, Condensed matter and materials physics. Amsterdam. Vol. 67, no. 13 (Apr. 2003), 132401 4p.pt_BR
dc.rightsOpen Accessen
dc.subjectMateriais antiferromagnéticospt_BR
dc.subjectInterações de troca (elétron)pt_BR
dc.subjectMateriais ferromagnéticospt_BR
dc.subjectRessonancia ferromagneticapt_BR
dc.subjectLigas de ferropt_BR
dc.subjectHisterese magnéticapt_BR
dc.subjectPolarização por intercâmbiopt_BR
dc.subjectMagnetizaçãopt_BR
dc.subjectLigas de níquelpt_BR
dc.titleFrequency-dependent exchange bias in NiFe/NiO filmspt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000353854pt_BR
dc.type.originEstrangeiropt_BR


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