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dc.contributor.authorSantos, Mauricio Cougo dospt_BR
dc.contributor.authorGeshev, Julian Penkovpt_BR
dc.contributor.authorSchmidt, Joao Edgarpt_BR
dc.contributor.authorTeixeira, Sergio Ribeiropt_BR
dc.contributor.authorPereira, Luis Gustavopt_BR
dc.date.accessioned2014-10-08T02:11:02Zpt_BR
dc.date.issued2000pt_BR
dc.identifier.issn1098-0121pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/104252pt_BR
dc.description.abstractThe magnetic behavior of a 60-Å Fe film grown on Si (111) is reported and discussed. Scanning tunneling microcopy images showed Fe stripes along one of the (110) directions in the (111) plane, which favors easy magnetization axis parallel to the stripes. Inverted in-plane hysteresis loops and loops with unusual local peaks were measured and interpreted. A phenomenological model was proposed to interpret the magnetization data and an excellent concordance between the experimental and the calculated curves was obtained. The peculiarities in the magnetization curves are directly related to the very small misorientation of the sample’s surface from the (111) plane, and to competing anisotropies. The model calculations showed that the magnetization leaves the sample’s plane for small fields, forming an obtuse angle with the field for some configurations, thus resulting in negative remanence, which was confirmed by the nonzero values of the normal to the plane magnetization component from the magneto-optic Kerr effect polarimetry measurements.en
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofPhysical review. B, Condensed matter and materials physics. Melville. Vol. 61, no. 2 (Jan. 2000), p. 1311-1314pt_BR
dc.rightsOpen Accessen
dc.subjectFilmes finos magneticospt_BR
dc.subjectMagnetizaçãopt_BR
dc.subjectMicroscopia de tunelamentopt_BR
dc.subjectAnisotropia magnéticapt_BR
dc.subjectFerropt_BR
dc.subjectSilíciopt_BR
dc.subjectMateriais ferromagnéticospt_BR
dc.subjectHisterese magnéticapt_BR
dc.subjectReversão de magnetizaçãopt_BR
dc.titleOrigin of the magnetization reversal of an Fe thin film on Si(111)pt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000269717pt_BR
dc.type.originEstrangeiropt_BR


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