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Experimental energy straggling of protons in SiO/sub 2/

dc.contributor.authorSantos, Jose Henrique Rodrigues dospt_BR
dc.contributor.authorGrande, Pedro Luispt_BR
dc.contributor.authorBehar, Monipt_BR
dc.contributor.authorDias, Johnny Ferrazpt_BR
dc.contributor.authorArista, Nestorpt_BR
dc.contributor.authorEckardt, J. C.pt_BR
dc.contributor.authorLantschner, G.H.pt_BR
dc.date.accessioned2014-10-04T02:13:31Zpt_BR
dc.date.issued2003pt_BR
dc.identifier.issn1050-2947pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/104175pt_BR
dc.description.abstractThe energy straggling of proton beams in SiO₂ has been measured in the energy range from 30 to 1500 keV using the transmission, nuclear reaction analysis and Rutherford backscattering techniques. The experimental results are compared with theoretical models. We observe that at energies around 200 keV the values obtained are larger than theoretical estimations. The straggling effect produced by the electron bunching in molecular media was calculated and it was found to be a possible cause of these differences at intermediate energies.en
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofPhysical review. A, Atomic, molecular, and optical physics. Melville. Vol. 68, no. 4 (Oct. 2003), 042903 6p.pt_BR
dc.rightsOpen Accessen
dc.subjectPerda de energia de particulaspt_BR
dc.subjectAnálise química nuclearpt_BR
dc.subjectRetroespalhamento rutherfordpt_BR
dc.subjectCompostos de silíciopt_BR
dc.titleExperimental energy straggling of protons in SiO/sub 2/pt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000396498pt_BR
dc.type.originEstrangeiropt_BR


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