Band-gap shift of the heavily doped single- and double-donor systems Si:Bi and Si:P,Bi
dc.contributor.author | Araújo, C. Moysés | pt_BR |
dc.contributor.author | Almeida, J. Souza de | pt_BR |
dc.contributor.author | Pepe, I. | pt_BR |
dc.contributor.author | Silva, Antonio Ferreira da | pt_BR |
dc.contributor.author | Sernelius, Bo E. | pt_BR |
dc.contributor.author | Souza, Joel Pereira de | pt_BR |
dc.contributor.author | Boudinov, Henri Ivanov | pt_BR |
dc.date.accessioned | 2014-09-26T02:10:56Z | pt_BR |
dc.date.issued | 2000 | pt_BR |
dc.identifier.issn | 1098-0121 | pt_BR |
dc.identifier.uri | http://hdl.handle.net/10183/103861 | pt_BR |
dc.description.abstract | The band-gap shift of the heavily single and double-donor doped systems Si:Bi and Si:P,Bi, prepared by ion implantation, was investigated theoretically and experimentally at room temperature. The calculations were carried out within a framework of the random-phase approximation and the temperature and different manybody effects were taken into account. The experimental data were obtained with photoconductivity measurements. Theoretical and experimental results fall closely together in a wide range of donor concentration. | en |
dc.format.mimetype | application/pdf | pt_BR |
dc.language.iso | eng | pt_BR |
dc.relation.ispartof | Physical review. B, Condensed matter and materials physics. Melville. Vol. 62, no. 19 (Nov. 2000), p. 12882-12887 | pt_BR |
dc.rights | Open Access | en |
dc.subject | Boro | pt_BR |
dc.subject | Semicondutores elementares | pt_BR |
dc.subject | Banda de energia proibida | pt_BR |
dc.subject | Semicondutores fortemente dopados | pt_BR |
dc.subject | Estados de impureza | pt_BR |
dc.subject | Fósforo | pt_BR |
dc.subject | Fotocondutividade | pt_BR |
dc.subject | Silicones | pt_BR |
dc.title | Band-gap shift of the heavily doped single- and double-donor systems Si:Bi and Si:P,Bi | pt_BR |
dc.type | Artigo de periódico | pt_BR |
dc.identifier.nrb | 000279154 | pt_BR |
dc.type.origin | Estrangeiro | pt_BR |
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