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dc.contributor.authorAraújo, C. Moyséspt_BR
dc.contributor.authorAlmeida, J. Souza dept_BR
dc.contributor.authorPepe, I.pt_BR
dc.contributor.authorSilva, Antonio Ferreira dapt_BR
dc.contributor.authorSernelius, Bo E.pt_BR
dc.contributor.authorSouza, Joel Pereira dept_BR
dc.contributor.authorBoudinov, Henri Ivanovpt_BR
dc.date.accessioned2014-09-26T02:10:56Zpt_BR
dc.date.issued2000pt_BR
dc.identifier.issn1098-0121pt_BR
dc.identifier.urihttp://hdl.handle.net/10183/103861pt_BR
dc.description.abstractThe band-gap shift of the heavily single and double-donor doped systems Si:Bi and Si:P,Bi, prepared by ion implantation, was investigated theoretically and experimentally at room temperature. The calculations were carried out within a framework of the random-phase approximation and the temperature and different manybody effects were taken into account. The experimental data were obtained with photoconductivity measurements. Theoretical and experimental results fall closely together in a wide range of donor concentration.en
dc.format.mimetypeapplication/pdfpt_BR
dc.language.isoengpt_BR
dc.relation.ispartofPhysical review. B, Condensed matter and materials physics. Melville. Vol. 62, no. 19 (Nov. 2000), p. 12882-12887pt_BR
dc.rightsOpen Accessen
dc.subjectBoropt_BR
dc.subjectSemicondutores elementarespt_BR
dc.subjectBanda de energia proibidapt_BR
dc.subjectSemicondutores fortemente dopadospt_BR
dc.subjectEstados de impurezapt_BR
dc.subjectFósforopt_BR
dc.subjectFotocondutividadept_BR
dc.subjectSiliconespt_BR
dc.titleBand-gap shift of the heavily doped single- and double-donor systems Si:Bi and Si:P,Bipt_BR
dc.typeArtigo de periódicopt_BR
dc.identifier.nrb000279154pt_BR
dc.type.originEstrangeiropt_BR


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