Now showing items 1-3 of 3

    • Damage accumulation in neon implanted silicon 

      Oliviero, Erwan Marie Hubert; Peripolli, Suzana Bottega; Amaral, Livio; Fichtner, Paulo Fernando Papaleo; Beaufort, Marie France; Barbot, Jean François; Donnelly, Stephen Eastwood (2006) [Journal article]
      Damage accumulation in neon-implanted silicon with fluences ranging from 5x1014 to 5x1016 Ne cm-² has been studied in detail. As-implanted and annealed samples were investigated by Rutherford backscattering spectrometry ...
    • In-situ transmission electron microscopy growth of nanoparticles under extreme conditions 

      Luce, Flavia Piegas; Oliviero, Erwan Marie Hubert; Azevedo, Gustavo de Medeiros; Baptista, Daniel Lorscheitter; Fichtner, Paulo Fernando Papaleo (2016) [Journal article]
      The formation and time resolved behavior of individual Pb nanoparticles embedded in silica have been studied by in-situ transmission electron microscopy observations at high temperatures (400–1100 C) and under 200 keV ...
    • Lithium implantation at low temperature in silicon for sharp buried amorphous layer formation and defect engineering 

      Oliviero, Erwan Marie Hubert; David, Marie-Laure; Fichtner, Paulo Fernando Papaleo; Beaufort, Marie France; Barbot, Jean François (2013) [Journal article]
      The crystalline-to-amorphous transformation induced by lithium ion implantation at low temperature has been investigated. The resulting damage structure and its thermal evolution have been studied by a combination of ...