Navegação por Autor "Hubert, Guillaume"
Resultados 1-1 de 1
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Circuit-level approaches to mitigate the process variability and soft errors in finFET logic cells
Zimpeck, Alexandra Lackmann (2019) [Tese]Process variability mitigation and radiation hardness are relevant reliability requirements as chip manufacturing advances more in-depth into the nanometer regime. The parameter yield loss and critical failures on system ...