Browsing Microelectronics by Subject "Single event upsets"
Now showing items 1-2 of 2
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Frame-level redundancy scrubbing technique for SRAM-based FPGAs
(2015) [Thesis]Reliability is an important design constraint for critical applications at ground-level and aerospace. SRAM-based FPGAs are attractive for critical applications due to their high performance and flexibility. However, they ... -
Towards resilient graphics processing units : designing fault tolerance techniques for radiation-induced faults
(2024) [Thesis]Graphic Processing Units (GPUs) have emerged as powerful computational tools, enabling high-performance parallel processing and driving significant advancements in various domains. However, their integration into safety-critical ...