Navegação Ciências Exatas e da Terra por Autor "Balen, Tiago Roberto"

Resultados 1-2 de 2

    • A self-checking scheme to mitigate single event upset effects in SRAM-based FPAAs 

      Balen, Tiago Roberto; Leite, Franco Ripoll; Kastensmidt, Fernanda Gusmão de Lima; Lubaszewski, Marcelo Soares (2009) [Artigo de periódico]
      In this work the problem of Single Event Upset (SEU) is considered in a recent analog technology: The Field Programmable Analog Arrays (FPAAs). Some FPAA models are based on SRAM memory cells to implement the user ...

    • Testing a fault tolerant mixed-signal design under TID and heavy ions 

      González Aguilera, Carlos Julio; Machado, Diego do Nascimento; Vaz, Rafael Galhardo; Vilas Bôas, Alexis Cristiano; Gonçalez, Odair Lelis; Puchner, Helmut K.; Added, Nemitala; Macchione, Eduardo; Aguiar, Vitor Ângelo Paulino de; Kastensmidt, Fernanda Gusmão de Lima; Medina, Nilberto Hedar; Guazzelli, Marcilei Aparecida; Balen, Tiago Roberto (2021) [Artigo de periódico]
      This work presents results of three distinctradiation tests performed upon a fault tolerant data acqui-sition system comprising a design diversity redundancytechnique. The first and second experiments are Total Ion-izing ...