The evolution of sputtered iron nitride thin films under thermal treatment

dc.contributor.author	Monteiro, W.A.	pt_BR
dc.contributor.author	Schreiner, Wido Herwig	pt_BR
dc.contributor.author	Baumvol, Israel Jacob Rabin	pt_BR
dc.contributor.author	Dionisio, Paulo Henrique	pt_BR
dc.contributor.author	Teixeira, Sergio Ribeiro	pt_BR
dc.contributor.author	Mosca Junior, Dante Homero	pt_BR
dc.date.accessioned	2014-05-17T02:06:45Z	pt_BR
dc.date.issued	1991	pt_BR
dc.identifier.issn	0021-8979	pt_BR
dc.identifier.uri	http://hdl.handle.net/10183/95343	pt_BR
dc.description.abstract	The thermal evolution of reactively sputtered iron nitride thin films has been investigated by xray diffraction, Mössbauer conversion electron spectroscopy, transmission electron microscopy, and magnetic measurementsT. he results show that, independentlyo f the original nitrogen content of the films, a similar composition of the end products after the 500 °C annealings is reached, being all composed of α-Fe plus y-Fe4 N in a wide range of relative proportions. The magnetic characteristics, however, are different depending on the nitrogen content of the as-depositedf ilms.	en
dc.format.mimetype	application/pdf
dc.language.iso	eng	pt_BR
dc.relation.ispartof	Journal of Applied Physics. Woodbury. Vol. 69, no. 1 (Jan. 1991), p. 261-267	pt_BR
dc.rights	Open Access	en
dc.subject	Intermetalicos	pt_BR
dc.subject	Filmes finos	pt_BR
dc.title	The evolution of sputtered iron nitride thin films under thermal treatment	pt_BR
dc.type	Artigo de periódico	pt_BR
dc.identifier.nrb	000055143	pt_BR
dc.type.origin	Estrangeiro	pt_BR

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