Listar Microelectrónica por tema "Machine Learning"
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Early evaluation of multicore systems soft error reliability using virtual platforms
(2018) [Tesis]The increasing computing capacity of multicore components like processors and graphics processing unit (GPUs) offer new opportunities for embedded and high-performance computing (HPC) domains. The progressively growing ... -
Early soft error reliability assessment of convolutional neural networks executing on resource-constrained IoT edge devices
(2022) [Tesis]Machine learning (ML) algorithms have provided straightforward solutions to a wide range of applications. The high computational demand of such algorithms limits their adoption in resource-constrained devices, which typically ...