Listar Microelectrónica por tema "Confiabilidade"
Mostrando ítems 1-2 de 2
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Early soft error reliability assessment of convolutional neural networks executing on resource-constrained IoT edge devices
(2022) [Tesis]Machine learning (ML) algorithms have provided straightforward solutions to a wide range of applications. The high computational demand of such algorithms limits their adoption in resource-constrained devices, which typically ... -
Enhancements on fault injection for xilinx 7 series and ultrascale+ SRAM-based FPGAs
(2022) [Tesis]Commercial grade SRAM-based FPGAs are susceptible to radiation effects that can affect safety- and mission-critical cyber-physical systems. Emulated fault injection is a test strat egy based on provoking failures in a ...