Listar Microelectrónica por autor "Aguiar, Ygor Quadros de"
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Radiation robustness of XOR and majority voter circuits at finFET technology under variability
Aguiar, Ygor Quadros de (2017) [Tesis de maestría]Advances in microelectronics have contributed to the size reduction of the technological node, lowering the threshold voltage and increasing the operating frequency of the systems. Although it has positive outcomes related ...