Browsing Microelectronics by Author "Gomes, Iuri Albandes Cunha"
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Use of approximate triple modular redundancy for fault tolerance in digital circuits
Gomes, Iuri Albandes Cunha (2018) [Thesis]Triple Modular Redundancy (TMR) is a well-known mitigation technique, which provides a full masking capability to single faults, although at a great cost in terms of area and power consumption. For that reason, partial ...