A cat tool for frequency-domain testing and diagnosis on analog
dc.contributor.author | Cota, Erika Fernandes | pt_BR |
dc.contributor.author | Di Domenico, Elias Jose | pt_BR |
dc.contributor.author | Lubaszewski, Marcelo Soares | pt_BR |
dc.date.accessioned | 2013-06-19T01:43:29Z | pt_BR |
dc.date.issued | 1997 | pt_BR |
dc.identifier.issn | 0104-6500 | pt_BR |
dc.identifier.uri | http://hdl.handle.net/10183/72561 | pt_BR |
dc.description.abstract | This paper presents a sensitivity-based test generation tool for analog multifrequency testing and diagnosis. The test generation procedure is based on sensitivity analysis and on fault simulation. This tool generates minimal test sets that maximize the coverage of soft, large and hard component faults and that enhance the coverage of interconnect shorts. An introduction to the problem of analog fault diagnosis considering both component and interconnect faults, is also presented. This procedure is now being automated by integrating commercially available tools for symbolic computation and electrical simulation. | en |
dc.format.mimetype | application/pdf | |
dc.language.iso | eng | pt_BR |
dc.relation.ispartof | Journal of the Brazilian Computer Society. Rio de Janeiro. Vol. 4, n. 2 (nov. 1997), p. 5-15 | pt_BR |
dc.rights | Open Access | en |
dc.subject | Computer-aided testing | en |
dc.subject | Cad : Microeletronica | pt_BR |
dc.subject | Testes : Circuitos analogicos | pt_BR |
dc.subject | Automatic test generation | en |
dc.subject | Analog and mixed-signal circuits | en |
dc.title | A cat tool for frequency-domain testing and diagnosis on analog | pt_BR |
dc.type | Artigo de periódico | pt_BR |
dc.identifier.nrb | 000154804 | pt_BR |
dc.type.origin | Nacional | pt_BR |
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