Reliability analysis of 0.5µm CMOS operational amplifiers under TID effects

dc.contributor.author	Cardoso, Guilherme Schwanke	pt_BR
dc.contributor.author	Balen, Tiago Roberto	pt_BR
dc.contributor.author	Lubaszewski, Marcelo Soares	pt_BR
dc.contributor.author	Gonçalez, Odair Lelis	pt_BR
dc.date.accessioned	2023-07-20T03:35:08Z	pt_BR
dc.date.issued	2014	pt_BR
dc.identifier.issn	1807-1953	pt_BR
dc.identifier.uri	http://hdl.handle.net/10183/262420	pt_BR
dc.format.mimetype	application/pdf	pt_BR
dc.language.iso	eng	pt_BR
dc.relation.ispartof	Journal of integrated circuits and systems. Vol. 9, n. 1(2014), p. 70-79	pt_BR
dc.rights	Open Access	en
dc.subject	Circuitos integrados	pt_BR
dc.subject	Cmos	pt_BR
dc.subject	Efeitos da radiação	pt_BR
dc.subject	Amplificadores operacionais	pt_BR
dc.title	Reliability analysis of 0.5µm CMOS operational amplifiers under TID effects	pt_BR
dc.type	Artigo de periódico	pt_BR
dc.identifier.nrb	000955020	pt_BR
dc.type.origin	Nacional	pt_BR

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