Listar Ingeniería por autor "Brederlow, Ralf"
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Statistical model for the circuit bandwidth dependence of low-frequency noise in deep-submicrometer MOSFETs
Wirth, Gilson Inacio; Silva, Roberto da; Brederlow, Ralf (2007) [Artículo de periódico]This paper covers measurement, analytical analysis, and Monte Carlo simulation of the frequency and bandwidth dependence of MOSFET low-frequency (LF) noise behavior. The model is based on microscopic device physics parameters, ...